Desenvolvimento de equipamento para avaliação da degradação de semicondutores de potência

Abstract

This work presents a development of an equipment to test power semiconductors (diodes and thyristors). These semiconductors are extensively used in static compensators. It is introduced the theoretic foundations about those devices and required parameters to analyse the degradation in forward blocking (for thyristors) and reverse blocking (for diodes an thyristors). The test circuits development is also presented as well as the equipment´s control software. The set of hardware/software of this instrument allows the automatic execution of tests, acquisiting and recording the informations of each semiconductor tested. Based on the results of these tests, a degradative analysis methodology is proposed, categorizing the components in three possible states of operation: good, deficient or fail. The temperature influence in the blocking characteristics is also analyzed.