Resumo:
This work presents a development of an equipment to test power
semiconductors (diodes and thyristors). These semiconductors are extensively
used in static compensators. It is introduced the theoretic foundations about
those devices and required parameters to analyse the degradation in forward
blocking (for thyristors) and reverse blocking (for diodes an thyristors). The test
circuits development is also presented as well as the equipment´s control
software. The set of hardware/software of this instrument allows the automatic
execution of tests, acquisiting and recording the informations of each
semiconductor tested. Based on the results of these tests, a degradative
analysis methodology is proposed, categorizing the components in three
possible states of operation: good, deficient or fail. The temperature influence in
the blocking characteristics is also analyzed.
